UV VIS SPECTROPHOTOMETER - THERMO EVOLUTION 1

Baseline Flatness

±0.001 A, 200–800 nm, 1.0 nm SBW, smoothed

Dimensions (L x W x H)

593 x 475 x 266 mm (23.3 x 18.7 x 10.6 in.)

Drift

<0.0005 A/hr., 500 nm, 1.0 nm SBW, 1 hour warmup

Electrical Requirements

100/240 V, 50/60 Hz selected automatically, 150 W maximum

Includes

Evolution One Plus UV-Vis Spectrometer

Lamp Life

>5 years or longer if not using live signal

Noise

0A: ≤0.00015 A
1A: ≤0.00025 A
2A: ≤0.00050 A
260 nm, 1.0 nm SBW, RMS<

Optical Design

Double-beam with sample and reference cuvette positions Czerny-Turner Monochromator

Pharmacopoeia Compliance Testing

Photometric Accuracy (60mg/L K2Cr2O7): ±0.010A
Stray Light: ≤1%T at 198 nm: KCI; ≤0.05%AT at 220 nm: Nal, Kl
Wavelength Accuracy: ±.5 nm 541.9, 546.1nm Hg emission lines, ±0.8 nm full range
Wavelength Repeatability: ≤0.05 nm, repetitive scanning of 546.1 nm Hg emission line

Photometric Accuracy

1 A: ±0.004 A, 2 A: ±0.008 A, Measured at 440 nm using neutral density filters traceable to NIST

Photometric Display

-0.3 to 4.0 A

Photometric Range

>3.5 A

Photometric Repeatability

1 A: ±0.0002 A

Scan Ordinate Modes

Absorbance, % Transmittance, % Reflectance, Kubelka-Munk, log (1/R), log (Abs), Abs*Factor, Intensity

Scan Speed

<1 to 6000 nm/min. (Variable)

Warranty

Instrument (2 years), Lamp (3 years)

Wattage

150 W max.

Wavelength Accuracy

±0.5 nm (541.9, 546.1 nm mercury lines), ±0.8 nm (full range 190 to 1100 nm)

Wavelength Data Interval

10, 5, 2, 1.0, 0.5, 0.2, 0.1 nm

Wavelength Repeatability

≤0.05 nm (546.1 nm mercury line, SD of 10 measurements)

Weight (English)

32 lb.

Weight (Metric)

14.5 kg

Detector Type

Dual Silicon Photodiodes

Light Source

Xenon Flash

Product Line

Evolution One

Spectral Bandwidth

1 nm

Type

Evolution One UV-Vis Spec

Wavelength Range

190 to 1100 nm

Unit Size

Each